Advantest introduces new channel cards and adds software-based. added


TOKYO, November 8, 2021 (GLOBE NEWSWIRE) – The leading supplier of semiconductor test equipment Advantest Corporation (TSE: 6857) has launched its new Link Scale ™ family of digital channel cards for the V93000 platform, enabling software-based functional testing and USB / PCI Express (PCIe) SCAN tests of advanced semiconductors. The new cards solve test challenges that require these interfaces to run in full protocol mode and add system-like tests Capabilities of the V93000.

Many of today’s complex system-on-chip (SoC) devices, microprocessors, graphics processors, and AI accelerators contain high-speed digital interfaces such as USB or PCIe. The new Link Scale cards use these interfaces for a very fast transfer of function and scan test content and at the same time increase test coverage and throughput. They use the same form factor as all other V93000 cards and are fully integrated into the test head.

The new Link Scale cards communicate with the device under test using a standard high-speed serial interface. This allows users to test the device in normal operating mode, using firmware and drivers similar to those in the target application. The high throughput of this approach keeps test time under control, while the additional functional coverage helps meet the high quality requirements of complex devices manufactured in the latest process nodes. Link-scale cards enable the use of the most modern debug tools (e.g. Lauterbach TRACE32®), Improvement of the process for the initial silicon provision and acceleration of the ramp-up to full production.

Pre-silicon functional tests can now be reused using the Portable Test and Stimulus Standard (PSS), supported by key Electronic Design Automation (EDA) tools, which greatly improves test quality and reduces time to market. The new cards also provide a customizable environment for host software to run on the cards so that real application testing can be performed with a full software stack on the V93000 system. This facilitates the exchange of test data between different environments, such as wafer sorting, final test and test at the system level. As a result, the Link Scale test solution can help users establish known good die (KGD) strategies for chiplets in 2.5D or 3D multi-die packages.

“The results of the collaboration between Advantest and Cadence will enable customers to reuse software-driven functional stress tests from design validation in high volume production with the Cadence Perspec System Verifier,” said Yogesh Goel, vice president of business and customer development for the Cadence Systems & Verification Group. “Customers can benefit from the use of a widely used tool chain to automatically generate and debug tests with high coverage and short execution times.”

“Using a high-speed connection, support for custom operating systems and drivers, integration of local computing power and support from Advantest’s EDA partners, our Link Scale cards provide testing and debugging capabilities unmatched by traditional ATE,” said Jürgen Serrer, Managing Executive Officer, responsible for the V93000 division of Advantest. “This product family expands the application range of our V93000 platform into new areas and significantly enriches digital testing on ATE.”

The new cards can be added to any V93000 Smart Scale or V93000 EXA Scale system and have been delivered to pilot customers for test program development in front of the equipment ramp for mass production. They will be generally available in the first quarter of 2022.

About Advantest Corporation
Advantest (TSE: 6857) is the leading manufacturer of automatic test and measurement equipment for the design and production of semiconductors for applications such as 5G communication, Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, intelligent medical equipment and more. Its state-of-the-art systems and products are integrated into the most advanced semiconductor production lines in the world. The company also conducts research and development to address emerging test challenges and applications, manufactures scanning electron microscopes for multivision metrology, essential for photomask manufacturing, and offers groundbreaking 3D imaging and analysis tools. Founded in Tokyo in 1954, Advantest is a global company with offices around the world and an international commitment to sustainable practices and social responsibility. More information is available at

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